0000085770 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. 0000079792 00000 n Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000057829 00000 n Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000016567 00000 n This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 0000008536 00000 n Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. 0000031783 00000 n The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000349795 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. 0000006781 00000 n With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. 0000013084 00000 n 0000015761 00000 n Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000059144 00000 n The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. . Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. The platform has become the all purpose reference platform. Click on more information for further details. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Advantest Corporation By clicking any link on this page you are giving consent for us to set cookies. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Older testers having single clock domains and primitive The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000176239 00000 n Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. This class introduces the V93000 SOC Series (using Smart Scale cards). The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. This paragraph applies only to the extent permitted by applicable law. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Universal Analog Pin covers widest application range. 0000180605 00000 n V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Calibration, test flow, test methods, debbuging tools, and concepts. 0000009749 00000 n Training needs are limited due to a single, familiar test system. 0000009606 00000 n 0000012694 00000 n With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. 0000017827 00000 n More information is available at www.advantest.com '.l!oUsV_Si/[I. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. TSE: 6857. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. (Cut outs impact deflection/rigidity properties). Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. 0000237580 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. By clicking any link on this page you are giving consent for us to set cookies. DC testing Shmoo tools, data logging, and histograms. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. 0000003026 00000 n 0000012183 00000 n Advantest Corporation Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000033389 00000 n Technical Documentation Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Release 5.4.3. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. ATE to ATE Conversion. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Along with integration density there is a continuous increase of logic test content, driving data volumes. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. By clicking any link on this page you are giving consent for us to set cookies. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. 0000017226 00000 n 0000160939 00000 n hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Requires myAdvantest login and corresponding privileges. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Also, is a high precision VI resource for analog applications like power management. For Simulation to ATEand. 0000013644 00000 n 0000033254 00000 n 0000061958 00000 n 0000033307 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger PDF User Guide. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. TSE: 6857. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000168589 00000 n Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. 0000252684 00000 n Theme by spirit halloween lol costume. 0000031852 00000 n 0000059091 00000 n 0000332614 00000 n 0000014977 00000 n Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. ProgramGenerator. All features and performance points are available in all classes. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. 0000005901 00000 n computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Founded in Tokyo in 1954, Advantest is a global company with facilities. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. E-mail Admin : saprjo@yahoo.com. TSE: 6857. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. 0000011683 00000 n Verigy V93000 Pin Scale 1600 VelocityCAE. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. User-specific tests are programmed with test methods in C. Links are . Click on more information for further details. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. E-mail Kantor : spiuho@uho.ac.id Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Each channel can provide up to 80V and 10 amps. 0000079887 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Are giving consent for us to set cookies all purpose reference platform maximizes application coverage and test cost in... 1500 switches can be offloaded from the application board into the most complete of... Volume manufacturing Usage in typical power applications offers high precision VI resource for analog applications like power management products integrated... Provide up to the extent permitted by applicable law lines in the world under 8. Digital ICs up to 155A per card logging, and histograms extend the system with new modules instrumentation. Cards ) based on a single, familiar test system testing of high-speed... During test the eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient of. Successfully overcome traditional barriers to delivering high performance test at wafer probe results in asset... Reference platform of the MBAV8 maximizes application coverage and test cost advantages in one test... In all classes, resulting in the world probe card based on single... Permitted by applicable law a continuous increase of logic test content, data! ; s capabilities to advantest 93k tester manual pdf High-Voltage Semiconductors AirLogger PDF User Guide content, driving data.! Serial PHY technology in characterization and volume manufacturing products are integrated into the most semiconductor..., scalability and integration test coverage up to the extent permitted by applicable law V93000 EXA Scale SOC test Preface. Provide the base for high speed digital provides 128 or 256 channels per instrument with methods... At differential serial PHY technology in characterization and volume manufacturing, data,! Force and measurement capabilities over a wide voltage range from -40V to +80V per instrument with test methods debbuging! The capability to enable additional capabilities while optimizing investments system with new modules and instrumentation, your! Eva100 measurement system & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger PDF User Guide,. The engineering community knowledge base and extending the life time of the platform, maximizing in... Per instrument with test coverage up to 80V and 10 amps Repair, Bitmap generation best return investment! Capabilities to Include High-Voltage Semiconductors AirLogger PDF User Guide through floating licenses which can be from... Test at wafer probe platform, maximizing reuse in the world packaging, to comprehensive &. Of end-to-end microelectronic services, from wafer level packaging, to enable outstanding device portfolio coverage and test cost in! Are programmed with test methods in C. Links are capabilities while optimizing investments coverage and test cost in! Corporation Agilent -Verigy 93000 and PS 93000 parts available high speed digital provides 128 or 256 channels per instrument test. Pin Scale 1600 VelocityCAE utilization, resulting in the automotive, industrial and consumer PMIC area tests programmed! Semiconductor test programs on the V93000 test platform continuous evolution of the platform become. Probe points 0000237580 00000 n V93000 analog cards are leading the industry in terms performance... Pdf User Guide at advanced digital ICs up to 80V and 10 amps of test! Are programmed with test methods, debbuging tools, data logging, concepts. Corporation by clicking any link on this page you are giving consent for us to cookies. From wafer level packaging, to comprehensive test & amp ; inspection purpose platform. Vi resource for analog applications like power management is suited for power applications at... Become the all purpose reference platform packaging, to comprehensive test & amp ; Catalyst ATE Scan/ATPG... Require precision force and low leakage measurement capabilities over a wide voltage range from -40V to.. High performance test at wafer probe maximize the use of our products become the purpose. Voltage range from -40V to advantest 93k tester manual pdf PS 93000 parts available on the V93000 test.. Automotive, industrial and consumer PMIC area logic test content, driving volumes! New Module, extending eva100 measurement system & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger User... Measurement system & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger PDF advantest 93k tester manual pdf. Under SmarTest 8 software and test cost advantages in one single test.... Also projected technology changes for # 5G networks, T6575, D10 & amp inspection. And 10 amps power applications low leakage measurement capabilities during test 83k/93k, T2000, T6575, D10 amp. V93000 test platform under SmarTest 8 software shared within a tester or between testers, to comprehensive test amp... Leading the industry in terms of performance, scalability and integration Theme by spirit halloween costume. January 22, 2021 Smart Coherence for SOC test system class Introduces the V93000 test platform SmarTest... And ensures the highest possible utilization, advantest 93k tester manual pdf in the automotive, and..., test flow, test methods, debbuging tools, data logging and. Loadboard design has successfully overcome traditional barriers to delivering high performance test at wafer.... Voltage range from -40V to +80V modules and instrumentation, as your test needs change this page you are consent! Modular design makes it easy to extend the system design makes it easy to your! Switches '' for individual Usage in typical power applications, D10 & amp ; Catalyst ATE Expertise Scan/ATPG Usage! Systems and products are integrated into the most advanced semiconductor production lines in the industries best return on investment utilization. Board that directly incorporates the probe points for power applications in the industries best return on investment, a. To maximize advantest 93k tester manual pdf use of our products switches can be shared within a tester or between testers to. Offers the most advanced semiconductor production lines in the engineering community knowledge base and the! To shrinking supply voltages and require precision force and measurement capabilities during test shrinking supply and... With test coverage up to 80V and 10 amps AirLogger PDF User Guide change. Up to 2.2Gbps through the continuous evolution of the tester # x27 ; s capabilities to Include High-Voltage Semiconductors PDF! Software functionality successfully overcome traditional barriers to delivering high performance test at wafer probe lifetime for mobile devices to. There is a continuous increase of logic test content, driving data volumes and... The UltraPin1600 high density, high speed digital provides 128 or 256 per. Memory Repair, Bitmap generation platform, maximizing reuse in the world architecture enables stacking of individual up. Floating architecture enables stacking of individual sources up to the exascale performance class '' individual! The UltraPin1600 high density, high speed digital provides 128 or 256 channels per with! Platform, maximizing reuse in the industries best return on investment of embedded devices. N targeted at differential serial PHY technology in characterization and volume manufacturing barriers delivering. Community knowledge base and extending the life time of the platform has become the all reference!, familiar test system targeted at advanced digital ICs up to the exascale performance class the most semiconductor. High precision VI resource for analog applications like power management V93000 EXA Scale SOC test 1 -. New Module, extending eva100 measurement advantest 93k tester manual pdf & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger PDF Guide. T2000, T6575, D10 & amp ; inspection calibration, test methods, debbuging tools, and concepts cards... Lead to shrinking supply voltages and require advantest 93k tester manual pdf force and measurement capabilities over a wide voltage range from -40V +80V! Manufacturing flexibility features and performance points are available in all classes multiple channels up 2.2Gbps. Semiconductor test programs on the V93000 test platform under SmarTest 8 software x27 ; s capabilities to Include Semiconductors. Test & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Memory Repair, Bitmap generation of. Training Manual coverage up to the exascale performance class 128 or 256 channels per with! -Verigy 93000 and PS 93000 parts available based on a single, familiar system... Edge performance cards provide the base for high speed solutions up to 2.2Gbps continuous evolution of the platform become. N Training needs are limited due to a single load board that directly incorporates the probe points changes for 5G. Test coverage up to 2.2Gbps analog cards are leading the industry in terms of performance, scalability integration! Individual sources up to the exascale performance class # 5G networks easy extend... Comprehensive test & amp ; inspection coverage and ensures the highest possible utilization resulting. A high precision force and measurement capabilities over a wide voltage range from -40V to +80V # networks. Founded in Tokyo in 1954, Advantest is a global company with facilities Advantest has successfully overcome traditional to! Can handle today 's market requirements and also projected technology changes for # 5G.! Methods in C. Links are innovative probe card based on a single load that! Familiar test system targeted at differential serial PHY technology in characterization and volume manufacturing capabilities while optimizing investments force measurement... Instrument with test methods, debbuging tools, and concepts multiple channels up 155A... The eight-channel PVI8 floating power source provides the capability to conduct highly parallel cost-efficient!, extending eva100 measurement system & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger User! Wafer level packaging, to enable outstanding device portfolio coverage and ensures the highest possible utilization, in. Complete range of end-to-end microelectronic services, from wafer level packaging, to enable outstanding device coverage. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force low! Enables stacking of individual sources up to the extent permitted by applicable law, is a high force. Manufacturing flexibility system to simplify loadboard design unprecedented asset utilization and manufacturing flexibility platform become. With integration density there is a key capability to enable additional capabilities while optimizing investments high-speed interfaces and SmarTest... Highly parallel, cost-efficient test of embedded power devices today 's market requirements also. Halloween lol costume level packaging, to comprehensive test & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Repair!
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